Structural and Optical Properties of InAsSbBi Grown by Molecular Beam Epitaxy on Offcut GaSb Substrates

نویسندگان

چکیده

Three InAsSbBi samples are grown by molecular beam epitaxy at 400 °C on GaSb substrates with three different offcuts: (100) on-axis, offcut 1° toward [011], and 4° [011]. The investigated using X-ray diffraction, Nomarski optical microscopy, atomic force transmission electron photoluminescence spectroscopy. layers 210 nm thick, coherently strained, show no observable defects. substrate is not observed to influence the structural interface quality of samples. Each sample exhibits small lateral variations in Bi mole fraction, largest variation on-axis growth. Bismuth rich surface droplet features all droplets isotropic elongated along [011¯] step edges No significant change angle observed.

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ژورنال

عنوان ژورنال: Photonics

سال: 2021

ISSN: ['2304-6732']

DOI: https://doi.org/10.3390/photonics8060215